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Innovation and experience in probe card assembly runs deep with several R&D staff members at Rucker Kolls. Not only does the Butterfly™ design provide a cost-effective solution for multi-DUT applications, but it has solved several problems inherent in Shelf- type probe cards.

  • Achieves higher yield with minimum expense

  • No need to change existing test equipment

  • Fewer probe tiers for better alignment and planarity

  • All scrub marks travel in same direction

  • Planarity and alignment do not drift after extended use

  • Option of 2x2 or greater for more efficient probe mapping

  • 60 micron pad pitch

  • Can be designed to use a generic PCB

  • Uniform beam length optimizes control of BCF

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