Butterfly

Innovation and experience in probe card assembly runs deep with several R&D staff members at Rucker Kolls. Not only does the Butterfly™ design provide a cost-effective solution for multi-DUT applications, but it has solved several problems inherent in Shelf- type probe cards.

Achieves higher yield with minimum expense
No need to change existing test equipment
Fewer probe tiers for better alignment and planarity
All scrub marks travel in same direction
Planarity and alignment do not drift after extended use
Option of 2x2 or greater for more efficient probe mapping
60 micron pad pitch
Can be designed to use a generic PCB
Uniform beam length optimizes control of BCF