Blades Technology is still used in many of today's applications and often used in high current/voltage applications.
Used in sensitive high frequency measurement applications
Mechanical and electrical properties can achieve excellent results in low noise, low current, and high temp applications
Used for semiconductor, laser applications
Has an addition of a stripline transmission path which ensures the integrity of the signal
Decoupling components can be added to the signal path for electrical enhancements
Still used in many of today’s small pin count applications
Are suitable for up to 100MHz
Used for semiconductor, hybrid circuit applications
Note: Part of why this parametric probing requirement works is the low leakage epoxy, special probes, layout of the probes, and proprietary cleaning solution along with how you handle the card.
R&K is leading the way in building and testing the industries parametric probing requirements. Support from nano-amp to single digit femto-amp probecards are available for your specific testing requirements.
R&K is fully Keithley certified and also supports the Agilent platform for parametric testing