 Rucker & Kolls delivers high quality, cost-effective solutions for wafer sort and wafer test areas of semiconductor facilities, as well as third-party test houses responsible for wafer test or final package testing. Contact us today and discover how Rucker & Kolls' innovative and proven methods will increase your test yields, decrease turn-times, and reduce your company's cost-of-test. |
Rucker & Kolls’ patented Butterfly™ Probe Card design improves test yield, reduces the cost of testing, and eliminates problems with multi-DUT applications |
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