Innovation and experience in probe card assembly runs deep with several R&D staff members at Rucker & Kolls. Not only does the Butterfly™ design provide a cost-effective solution for multi-DUT applications, but it has solved several problems inherent in Shelf- type probe cards.

• Achieves higher yield with minimum expense
• No need to change existing test equipment
• Fewer probe tiers for better alignment and planarity
• All scrub marks travel in same direction
• Planarity and alignment do not drift after extended use
• Option of 2x2 or greater for more efficient probe mapping
• 60 micron pad patch
• Can be designed to use a generic PCB
• Uniform beam length optimizes control of BCF