Rucker Kolls, Inc. Innovative Solutions for ATE Test Interface Products


Rucker Kolls delivers high quality, cost-effective solutions for wafer sort and wafer test areas of semiconductor facilities, as well as third-party test houses responsible for wafer test or final package testing.


Contact us today and discover how Rucker Kolls' innovative and proven methods will increase your test yields, decrease turn-times, and reduce your company's cost-of-test.

Butterfly Solution

Rucker Kolls’ patented Butterfly™ Probe Card design improves test yield, reduces the cost of testing, and eliminates problems with multi-DUT applications

Read More

Copyright © 2012 Rucker Kolls Inc. 
Rucker Kolls, the Rucker Kolls logo and Butterfly design are trademarks or registered trademarks of Rucker Kolls Inc.
All other trademarks are the property of their respective owners.      Designed by Sterlingci.com